Supported Microcontrollers

Follows various debug I/F
RAMScope support probe

Supported Microcontrollers(For Multi RAM data monitor (measurement) tool )

The following are supported with microcontrollers for MCU probes(GT10□△△△(□:2/6)) and Automotive probe(GT10□△△△(□:3/4/7)) products.

Semiconductor
Supplier
Microcontroller
Series/Family
Name
Representative Microcontroller Model Name:
Debug-I/F(Microcontroller name)
Probe Type Name:GT10□△△△
△△△
MCU
type
GT102 GT103 GT104 GT106 GT107
Renesas
Electronics
SH2/SH2A
Series
Debug-I/F:AUD(Sh705x)
Debug-I/F:AUDⅡ(sh725x)
H02 ◯ ◯ ◯    
SH7450
Series
Debug-I/F:AUDR(SH'745x) H03 ◯ ◯ ◯    
SH7253
Series
Debug-I/F:HUDI(SH72531) H04 ◯ ◯ ◯    
M32R
Family
Debug-I/F:RTD(M32R/ECU) L01 ◯   ◯    
Debug-I/F:NBD(M32R/ECU) L02 ◯ ◯ ◯    
Debug-I/F:SDI(M32R/ECU) L03 ◯        
V850E1
Family
Debug-I/F:NBD
(V850/IA1,V850/PG2)
N01 ◯ ◯ ◯    
V850E2
Family
Debug-I/F:NEXUS
(V850E2/Px4,V850E2/Fx4)
N04 ◯ ◯ ◯    
RH850
Family
Debug-I/F:NEXUS
(RH850/E1x,RH850/F1x,
RH850/p1x,RH850/c1x)
H06 ◯ ◯ ◯    
RL78
Family
Debug-I/F:LPD
(RL78/F13,F14,F15)
H07 ◯        
RX
Family
Debug-I/F:JTAG
(RX600,RX700 Series
RX660,RX26T Group)
H08 ◯ ◯ ◯    
RH850
Family
Debug-I/F:AUD
(RH850/C1x)
H09   ◯      
Debug-I/F:NEXUS
(RH850/P1H-C,P1M-C,P1L-C)
H10 ◯ ◯ ◯    
RH850
Family
Debug-I/F:NEXUS
(RH850/E2M,E2H,E2UH)
H11       ◯ ◯
R-Car S4
(G4MH)
Debug-I/F:NEXUS
(R-Car S4-8,S4N-8,S4-4,S4N-4)
H12       ◯  
RL78
Family
Debug-I/F:1 wire Serial
(RL78/F23, F24)
H13       ◯  
RA
Family
Debug-I/F:SWJ(SWD/JTAG)
(RA6・RA4・RA2 Series)
A01       ◯ ◯
R-Car
Family
Debug-I/F:SWJ(SWD/JTAG)
R-Car S4(Cortex-R52),
R-Car V4H(Cortex-R52)
A01       ◯ ◯
NXP
Semiconductors
MPC55xx
Family
Debug-I/F:NEXUS
(MPC5554,MPC5567)
M01 ◯   ◯    
MPC56xx
Family
Debug-I/F:NEXUS
(MPC560x)
M02 ◯   ◯    
Debug-I/F:NEXUS
(MPC5643L)
M03 ◯ ◯ ◯    
Debug-I/F:NEXUS
(MPC5634M)
M04 ◯ ◯ ◯    
MPC57xx
Family
Debug-I/F:NEXUS
(MPC5744P)
M05 ◯ ◯ ◯    
Debug-I/F:NEXUS
(MPC5746R,MPC5777M)
M06 ◯ ◯      
Debug-I/F:NEXUS
(MPC5775K,MPC5774K)
M07 ◯ ◯ ◯    
LPC4300
Series
Debug-I/F:SWJ(SWD/JTAG)
(LPC4357)
A01       ◯ ◯
S32K
Series
Debug-I/F:SWJ(SWD/JTAG)
(S32K142,S32K144,S32K3xx)
A01       ◯ ◯
STMicro
electronics
SPC5
Family
Debug-I/F:NEXUS
(SPC57Sxx,SPC574Sxx)
S01 ◯        
Debug-I/F:NEXUS
(SPC58ECxx,SPC584Cxx)
S02 ◯        
Debug-I/F:NEXUS
(SPC58NExx)
S03 ◯   ◯    
Stellar
Family
Debug-I/F:SWJ (SWD/JTAG)
(Stellar E Series)
A01       ◯ ◯
Infineon
Technologies
(The Former "Cypress
Semiconductor")
FR81
Family
Debug-I/F:MDI
(CY91580,CY91780)
F03 ◯        
Debug-I/F:MDI
(CY91520)
F04 ◯        
Traveo
CY9D560
Series
Debug-I/F:JTAG
(CY9D56X)
F06 ◯ ◯ ◯    
Traveo
T2G
Family
Debug-I/F:SWJ(SWD/JTAG)
(CYT2B9x,CYT2B7x)
A01       ◯ ◯
Infineon
Technologies
AUDO MAX
Family
Debug-I/F:JTAG
(TC1782,TC1789)
I01 ◯ ◯ ◯    
AURIX-TC2x
Family
Debug-I/F:JTAG
(TC21x,TC22x,TC23x,TC24x,
TC26x,TC27x,TC29x)
I02 ◯ ◯ ◯    
Debug-I/F:DAP
(TC21x,TC22x,TC23x,TC24x,
TC26x,TC27x,TC29x)
I03 ◯ ◯ ◯    
AURIX-TC3x
Family
Debug-I/F:DAP
(TC33x,TC36x,TC37x,
TC38x,TC39x)
I04       ◯ ◯
AURIX-TC4x
Family
Debug-I/F:DAP
(TC4Dx)
I05       ◯ ◯
TLE987x
Series
Debug-I/F:SWJ(SWD/JTAG)
(TLE9877,TLE9879)
A01       ◯ ◯
Toshiba Electronic
Devices & Storage
TX03 Series
TXZ4 Series
TXZ+4A Series
Debug-I/F:NBD
(M350 Group,
M4K Group(1)/(2),
TMPM4K Group(1)/(2)
TMPM4M Group(1))
T01 ◯        


Arm® Core Support Probe

 
Semiconductor
Supplier
Microcontroller
Series/Family Name
Debug-I/F Probe Type Name:GT10□△△△
△△△
MCU
type
GT102 GT103 GT104 GT106 GT107
Renesas
Electronics
RA Family
(RA6・RA4・RA2 Series)
Debug-I/F:SWJ(SWD/JTAG) A01       ◯ ◯
Renesas
Electronics
R-Car Family
(R-Car S4(Cortex-R52),
R-Car V4H(Cortex-R52))
     
NXP
Semiconductors
LPC4300 Series
(LPC4357)
     
NXP
Semiconductors
S32K Series
(S32K142,S32K144,S32K3xx)
     
STMicro
electronics
Stellar Family
(Stellar E Series)
     
Infineon
Technologies
TLE987x Series
(TLE9877,TLE9879)
     
Infineon
Technologies
(The Former "Cypress
Semiconductor")
TRAVEO T2G Family
(CYT2B9x,CYT2B7x)
     

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